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Hysitron TI-700 Nanomechanical Test System
The nanomechanical test system used by AEM-C is a more basic model manufactured by Hysitron, Inc., focused mainly on nanoindentation, nanowear, and nanoscratch tests. Located in the AEM-C laboratory, the system features an enclosure to reduce thermal, acoustic, and air current interference, as well as an active vibration isolation platform that can eliminate vibration noise down to 0.5 Hz. It is controlled by a dedicated computer workstation, which includes analysis software from the manufacturer.
Nanoindentation is a form of indentation hardness testing that was developed in the 1970s which can be applied to small volumes. It operates somewhat similarly to regular hardness testing, except that much smaller loads and tip sizes are used, so that the indentation area is only nanometers or micrometers in scale, hence the name of the test. However, rather than measure the area of the indentation, the depth of the tip's penetration is continuously monitored in order to generate a "Force-Displacement" curve, from which the sample material properties can be derived. This is an automated process, and sample measurement patterns can be programmed into the workstation computer to take repeatable measurements over an area of the sample coupon, with tabulated results being generated for export.
Nanowear is a process which removes material from the surface of the sample coupon in pre-specified patterns, from which the friction coefficient and wear rates of the material can be determined. Nanoscratch testing uses a similar process, only it uses a single scratch in order to find friction forces, as well as critical loads for film failures and adhesion measurements.
This system also features In-situ SPM imaging, which allows for precise indenter tip placement and pre- and post-imaging of indents. There is nanonmeter resolution with adjustable gain control and a variable scan rate, with topographical scanning that can produce presentation-grade images.
|Transducer Specifications||Scanner Specifications||Nanoscratch Specifications|
|Maximum Force:||10 mN||X-Y Scan Size:||60 μm||Maximum Force:||2 mN|
|Load Noise Floor:||100 nN||Z Travel:||4 μm||Load Noise Floor:||5 μN|
|Disp. Noise Floor:||0.2 nm||Maximum San Rate:||3 Hz||Maximum Disp.:||15 μm|
|Thermal Drift:||<0.05 nm/sec||Disp. Noise Floor:||5 nm|
|Manual Newport Translation Stage|
|X and Y Stage:||25 mm x 25 mm Travel|
|Z Stage:||50 mm Travel|
|Dimensionally stable granite platform and bridge|